McMarr, P.: search on Z-Library

The world's largest scientific articles store. 70,000,000+ articles for free.

Don't use scam websites

1

[IEEE 2010 IEEE International SOI Conference - San Diego, CA, USA (2010.10.11-2010.10.14)] 2010 IEEE International SOI Conference (SOI) - Total dose radiation response of a 45nm SOI Technology

Liu, S. T., Hurst, A., Hughes, H. L., McMarr, P., Benedito, J., Capasso, C.

Year:

2010

Language:

english

File:

PDF, 1.93 MB

english, 2010

2

Radiation Studies of Spin-Transfer Torque Materials and Devices

Hughes, H., Bussmann, K., McMarr, P. J., Shu-Fan Cheng,, Shull, R., Chen, A. P., Schafer, S., Mewes, T., Ong, A., Chen, E., Mendenhall, M. H., Reed, R. A.

Journal:

IEEE Transactions on Nuclear Science

Year:

2012

Language:

english

File:

PDF, 1.09 MB

english, 2012

3

-permeability measurements

Mrstik, B. J., McMarr, P. J.

Journal:

Physical Review B

Year:

1993

Language:

english

File:

PDF, 687 KB

english, 1993

4

Thickness dependence of optical gap and void fraction for sputtered amorphous germanium

Pilione, L. J., Vedam, K., Yehoda, J. E., Messier, R., McMarr, P. J.

Journal:

Physical Review B

Year:

1987

Language:

english

File:

PDF, 142 KB

english, 1987

5

on silicon substrates

Mrstik, B. J., McMarr, P. J., Saks, N. S., Rendell, R. W., Klein, R. B.

Journal:

Physical Review B

Year:

1993

Language:

english

File:

PDF, 153 KB

english, 1993

6

14-mev neutron and co/sub 60/ gamma testing of a power mosfet optocoupler

McMarr, P.J., Nelson, M.E., Hughes, H., Delikat, K.J.

Journal:

IEEE Transactions on Nuclear Science

Year:

2003

Language:

english

File:

PDF, 392 KB

english, 2003

7

Impact of Cumulative Irradiation Degradation and Circuit Board Design on the Parameters of ASETs Induced in Discrete BJT-based Circuits

Roche, Nicolas J.-H., Khachatrian, Ani, Buchner, Stephen P., Warner, J. H., Hughes, Harold, McMarr, Patrick, McMorrow, Dale

Journal:

IEEE Transactions on Nuclear Science

Year:

2015

Language:

english

File:

PDF, 1.95 MB

english, 2015

8

Analysis of Angular Dependence of Single-Event Latchup Sensitivity for Heavy-Ion Irradiations of ${\hbox{0.18-}}\mu\hbox{m}$ CMOS Technology

Artola, L., Roche, N. J.-H., Hubert, G., Al Youssef, A., Khachatrian, A., McMarr, P., Hughes, H.

Journal:

IEEE Transactions on Nuclear Science

Year:

2015

Language:

english

File:

PDF, 1.13 MB

english, 2015

9

[IEEE 2015 IEEE Radiation Effects Data Workshop (REDW) - Boston, MA, USA (2015.7.13-2015.7.17)] 2015 IEEE Radiation Effects Data Workshop (REDW) - Total Ionizing Dose Radiation Effects on 14 nm FinFET and SOI UTBB Technologies

Hughes, Harold, McMarr, Patrick, Alles, Michael, Zhang, Enxia, Arutt, Charles, Doris, Bruce, Liu, Derrick, Southwick, Richard, Oldiges, Philip

Year:

2015

Language:

english

File:

PDF, 4.14 MB

english, 2015

10

Computer applications in education and training: taking that first byte: The process

Journal:

Computer Programs in Biomedicine

Year:

1983

Language:

english

File:

PDF, 251 KB

english, 1983

11

Computer applications in education and training: taking that first byte: An overview of the field

Journal:

Computer Programs in Biomedicine

Year:

1983

Language:

english

File:

PDF, 553 KB

english, 1983

12

Fabrication of nanometer-scale conducting silicon wires with a scanning tunneling microscope

P.M. Campbell, E.S. Snow, P.J. McMarr

Journal:

Solid-State Electronics

Year:

1994

Language:

english

File:

PDF, 919 KB

english, 1994

13

Electron and hole trapping in thermal oxides that have been ion implanted

B.J Mrstik, H.L Hughes, P.J McMarr, P Gouker

Journal:

Microelectronic Engineering

Year:

2001

Language:

english

File:

PDF, 141 KB

english, 2001

14

Thin BOX SIMOX silicon-on-insulator substrates for radiation tolerent advanced electronics

L.P. Allen, M.L. Alles, R.P. Dolan, H.L. Hughes, P. McMarr

Journal:

Microelectronic Engineering

Year:

1997

Language:

english

File:

PDF, 286 KB

english, 1997

15

Relationship between hole trapping and oxide density in thermally grown SiO2

B.J. Mrstik, V.V. Afanas'ev, A. Stesmans, P.J. McMarr

Journal:

Microelectronic Engineering

Year:

1999

Language:

english

File:

PDF, 309 KB

english, 1999

16

Spatial Localization of Carrier Traps in 4H-SiC MOSFET Devices Using Thermally Stimulated Current

Marko J. Tadjer, Robert E. Stahlbush, Karl D. Hobart, Patrick J. McMarr, Hap L. Hughes, Eugene A. Imhoff, Fritz J. Kub, Sarah K. Haney, Anant Agarwal

Journal:

Journal of Electronic Materials

Year:

2010

Language:

english

File:

PDF, 644 KB

english, 2010

17

AFM-based fabrication of Si nanostructures

P.M. Campbell, E.S. Snow, P.J. McMarr

Journal:

Physica B: Condensed Matter

Year:

1996

Language:

english

File:

PDF, 240 KB

english, 1996

18

Roughness measurements by spectroscopic ellipsometry

Blanco, J. R., McMarr, P. J., Vedam, K.

Journal:

Year:

1985

Language:

english

File:

PDF, 1.95 MB

english, 1985

19

Measurement of the thickness of the surface layer on amorphous Ge films using spectroscopic ellipsometry: validity of effective medium modeling

McMarr, Patrick J., Blanco, J. R.

Journal:

Year:

1988

Language:

english

File:

PDF, 1.13 MB

english, 1988

20

Roughness measurements of Si and Al by variable angle spectroscopic ellipsometry

Blanco, Julio R., McMarr, Patrick J.

Journal:

Year:

1991

Language:

english

File:

PDF, 1.27 MB

english, 1991

21

Comparison of charge trapping in undoped oxides made by low- and high-temperature deposition techniques

Mrstik, B.J., Hughes, H.L., Lawrence, R.K., McMarr, P.J., Gouker, P.

Journal:

IEEE Transactions on Nuclear Science

Year:

2001

Language:

english

File:

PDF, 113 KB

english, 2001

22

Nanofabrication with proximal probes

P.M. Campbell, E.S. Snow, P.J. McMarr

Journal:

Surface Science

Year:

1996

Language:

english

File:

PDF, 331 KB

english, 1996

23

Effect of Total Ionizing Dose on a Bulk 130 nm Ring Oscillator Operating at Ultra-Low Power

Casey, Megan C., Armstrong, Sarah E., Arora, Rajan, King, Michael P., Ahlbin, Jonathan R., Francis, S. Ashley, Bhuva, Bharat L., McMorrow, Dale, Hughes, Harold L., McMarr, Patrick J., Melinger, Joseph

Journal:

IEEE Transactions on Nuclear Science

Year:

2009

Language:

english

File:

PDF, 719 KB

english, 2009

24

Hole and electron trapping in ion implanted thermal oxides and SIMOX

Mrstik, B.J., Hughes, H.L., McMarr, P.J., Lawrence, R.K., Ma, D.I., Isaacson, I.P., Walker, R.A.

Journal:

IEEE Transactions on Nuclear Science

Year:

2000

Language:

english

File:

PDF, 137 KB

english, 2000

25

[IEEE 2011 IEEE Radiation Effects Data Workshop (in conjunction with NSREC 2011) - Las Vegas, NV, USA (2011.07.25-2011.07.29)] 2011 IEEE Radiation Effects Data Workshop - SEE and TID Results for Commercial Non-Optogalvanic Isolators for Space Application

Jacobson, Mark A., Buchner, Stephen P., Hughes, Harold L., McMarr, Patrick J.

Year:

2010

Language:

english

File:

PDF, 2.74 MB

english, 2010

26

Intrinsic Tolerance to Total Ionizing Dose Radiation in Gate-All-Around MOSFETs

Comfort, Everett S., Rodgers, Martin P., Allen, William, Gausepohl, Steve C., Zhang, Enxia X., Alles, Michael L., Hughes, Harold L., McMarr, Patrick J., Lee, Ji Ung

Journal:

IEEE Transactions on Nuclear Science

Year:

2013

Language:

english

File:

PDF, 642 KB

english, 2013

27

Fabrication of nanometer-scale side-gated silicon field effect transistors with an atomic force microscope

Campbell, P. M., Snow, E. S., McMarr, P. J.

Journal:

Applied Physics Letters

Year:

1995

Language:

english

File:

PDF, 424 KB

english, 1995

28

Nondestructive depth profiling by spectroscopic ellipsometry

Vedam, K., McMarr, P. J., Narayan, J.

Journal:

Applied Physics Letters

Year:

1985

Language:

english

File:

PDF, 498 KB

english, 1985

29

Spectroscopic ellipsometry: A new tool for nondestructive depth profiling and characterization of interfaces

McMarr, P. J., Vedam, K., Narayan, J.

Journal:

Journal of Applied Physics

Year:

1986

Language:

english

File:

PDF, 866 KB

english, 1986

30

The Effect of Active Delay Element Resistance on Limiting Heavy Ion SEU Upset Cross-Sections of SOI ADE/SRAMs

Liu, S. T., Nelson, D. K., Tsang, J. C., Golke, K., Fechner, P., Heikkila, W., Brewster, N., Van Cleave, R., Liu, H. Y., McMarr, P. J., Hughes, H. L., Ziegler, J. F.

Journal:

IEEE Transactions on Nuclear Science

Year:

2007

Language:

english

File:

PDF, 373 KB

english, 2007

31

[IEEE 2001 IEEE International SOI Conference. Proceedings - Durango, CO, USA (1-4 Oct. 2001)] 2001 IEEE International SOI Conference. Proceedings (Cat. No.01CH37207) - Evaluating manufacturability of radiation-hardened SOI substrates

Alles, M., Dolan, B., Hughes, H., McMarr, P., Gouker, P., Liu, M.

Year:

2001

Language:

english

File:

PDF, 235 KB

english, 2001

32

Asymmetric SEU in SOI SRAMs

McMarr, P.J., Nelson, M.E., Liu, S.T., Nelson, D., Delikat, K.J., Gouker, P., Tyrrell, B., Hughes, H.

Journal:

IEEE Transactions on Nuclear Science

Year:

2005

Language:

english

File:

PDF, 241 KB

english, 2005

33

Charge trapping versus buried oxide thickness for SIMOX structures

Lawrence, R.K., Ioannou, D.E., Hughes, H.L., McMarr, P.J., Mrstik, B.J.

Journal:

IEEE Transactions on Nuclear Science

Year:

1995

Language:

english

File:

PDF, 697 KB

english, 1995

34

[IEEE 1996 IEEE International SOI Conference Proceedings - Sanibel Island, FL, USA (30 Sept.-3 Oct. 1996)] 1996 IEEE International SOI Conference Proceedings - Effects of process conditions on the material characteristics of SIMOX with ITOX

Anc, M.J., McMarr, P.J., Mrstik, B.J., Hughes, H.L.

Year:

1996

Language:

english

File:

PDF, 172 KB

english, 1996

35

[IEEE 1996 IEEE International SOI Conference Proceedings - Sanibel Island, FL, USA (30 Sept.-3 Oct. 1996)] 1996 IEEE International SOI Conference Proceedings - Positive charge trapping in SOI materials

Lawrence, R.K., Mrstik, B.J., Hughes, H.L., McMarr, P.J., Anc, M.J.

Year:

1996

Language:

english

File:

PDF, 190 KB

english, 1996

36

[IEEE 2009 IEEE Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC 2009) - Orlando, FL (2009.10.24-2009.11.1)] 2009 IEEE Nuclear Science Symposium Conference Record (NSS/MIC) - Thermally stimulated current separation of hole and acceptor trap density in 4H-SiC epitaxial MOS devices using gamma irradiation

Tadjer, M.J., Hobart, K.D., Stahlbush, R.E., McMarr, P.J., Hughes, H.L., Imhoff, E.A., Kub, F.J., Haney, S.K.

Year:

2009

Language:

english

File:

PDF, 642 KB

english, 2009

37

[IEEE IEEE International SOI Conference - Ponte Vedra Beach, FL (October 6-8, 1992)] IEEE International SOI Conference - Prediction of the Radiation Response of Simox Using Spectroscopic Ellipsometry

McMarr, P.J., Mrstik, B.J., Lawrence, R.K.

Year:

1992

File:

PDF, 100 KB

1992

38

Dependence of radiation induced buried oxide charge on silicon-on-insulator fabrication technology

Lawrence, R.K., Mrstik, B.J., Hughes, H.L., McMarr, P.J.

Journal:

IEEE Transactions on Nuclear Science

Year:

1996

Language:

english

File:

PDF, 633 KB

english, 1996

39

Creation of Individual Defects at Extremely High Proton Fluences in Carbon Nanotube $p{-}n$ Diodes

Comfort, Everett S., Fishman, Matthew, Malapanis, Argyrios, Hughes, Harold, McMarr, Patrick, Cress, Cory D., Bakhru, Hassaram, Lee, Ji Ung

Journal:

IEEE Transactions on Nuclear Science

Year:

2011

Language:

english

File:

PDF, 393 KB

english, 2011

40

Proton-induced upset in SOI CMOS SRAMS

Liu, S.T., Liu, H.Y., Anthony, D., Heikkila, W., Hughes, H., Campbell, A., Petersen, E.L., McMarr, P.J.

Journal:

IEEE Transactions on Nuclear Science

Year:

2004

Language:

english

File:

PDF, 203 KB

english, 2004

41

Total-Ionizing-Dose Response of Narrow, Long Channel 45 nm PDSOI Transistors

Alles, Michael L., Hughes, Harold L., Ball, Dennis R., McMarr, Patrick J., Schrimpf, Ronald D.

Journal:

IEEE Transactions on Nuclear Science

Year:

2014

Language:

english

File:

PDF, 1.20 MB

english, 2014

42

Spectroscopic ellipsometry study of glow-discharge-deposited thin films of a-Ge:H

Blanco, J. R., McMarr, P. J., Vedam, K., Ross, R. C.

Journal:

Journal of Applied Physics

Year:

1986

Language:

english

File:

PDF, 869 KB

english, 1986

43

The role of nanoclusters in reducing hole trapping in ion implanted oxides

Mrstik, B.J., Hughes, H.L., Gouker, P., Lawrence, R.K., McMarr, P.J.

Journal:

IEEE Transactions on Nuclear Science

Year:

2003

Language:

english

File:

PDF, 429 KB

english, 2003

44

Fabrication of silicon nanostructures with a scanning tunneling microscope

Snow, E. S., Campbell, P. M., McMarr, P. J.

Journal:

Applied Physics Letters

Year:

1993

Language:

english

File:

PDF, 754 KB

english, 1993

45

A study of Si implanted with oxygen using spectroscopic ellipsometry

McMarr, P. J., Mrstik, B. J., Barger, M. S., Bowden, G., Blanco, J. R.

Journal:

Journal of Applied Physics

Year:

1990

Language:

english

File:

PDF, 1.62 MB

english, 1990

46

Thickness-dependent void fraction of rf-sputtered amorphous Ge films by spectroscopic ellipsometry

P. J. Mcmarr, J. R. Blanco, K. Vedam, R. Messier, L. Pilione

Year:

1986

Language:

english

File:

PDF, 493 KB

english, 1986

47

Relationship between radiation response and density of buried oxide in separation-by-implantation-of-oxygen material

Mrstik, B. J., McMarr, P. J., Lawrence, R. K.

Journal:

Applied Physics Letters

Year:

1994

Language:

english

File:

PDF, 250 KB

english, 1994

48

Relationship between oxide density and charge trapping in SiO[sub 2] films

Mrstik, B. J., Afanas’ev, V. V., Stesmans, A., McMarr, P. J., Lawrence, R. K.

Journal:

Journal of Applied Physics

Year:

1999

Language:

english

File:

PDF, 484 KB

english, 1999

49

Improvement in electrical properties of buried SiO2 layers by high-temperature oxidation

Mrstik, B. J., McMarr, P. J., Hughes, H. L., Anc, M. J., Krull, W. A.

Journal:

Applied Physics Letters

Year:

1995

Language:

english

File:

PDF, 479 KB

english, 1995

50

[IEEE 1998 IEEE International SOI Conference Proceedings - Stuart, FL, USA (5-8 Oct. 1998)] 1998 IEEE International SOI Conference Proceedings (Cat No.98CH36199) - High quality low-dose low-energy SIMOX implanted in high current oxygen implanter

Anc, M.J., Farley, M., Jiao, J., Seraphin, S., Kirchhoff, J., McMarr, P.J., Hughes, H.L.

Year:

1998

Language:

english

File:

PDF, 275 KB

english, 1998